Application of synopsys' taurus TCAD in developing CMOS fabrication process modules
U. Hashim, Chin Seng Fatt, S. Sakrani
(1-10)

First-principles calculations of the structural and electronic properties of AlN, GaN, InN, AlGaN and InGaN
Abbès Beloufa, Zouaoui Bensaad, Bel-Abbes Soudini, Nadir Sekkal, Abdelallah Bensaad, Hamza Abid
(11-22)

Estimation of thermal contact resistance in metal-plastic interface of semiconducting electronic devices
S. A. Oke, A. A. Oyekunle, T. A. O. Salau, A. A. Adegbemile, K. O. Lawal
(23-39)

Studying the different effects of gamma and x-ray irradiation on the electrical properties of silicon diode type 1N1405
Jassim M. Najim
(41-46)

Electronic and positronic studies of zinc-blend boron phosphide BP underpressure
M. Sehil, H. Abid, A. Lachebi, Y. Al-Douri
(47-62)

Modelling of the film thickness effecton the carrier's mobility in polysilicon thin film transistors
Y. Bourezig, B. Bouabdallah, S. Mansouri, F. Gaffiot
(63-74)

2D-Modelling for the simulation of current-voltage characteristics in polysilicon schottky diode deposited by LPCVD and SAPCVD methods.
Nadia Benseddik, Mohammed Amrani, Zineb Benamara, Tayeb Mohammed-Brahim
(75-89)

Description of yrast states and deformation changes in tantalum nuclei (Ta)
N. Mansour
(91-97)

Electrical and structural properties of flash evaporation InSb thin films
S. K. J. Al-Ani, Y. N. Obaid, S. J. Kasim, M. A. Mahdi
(99-107)

Multilayer antireflection coatings model for red emission of silicon for optoelectronic applications
Kifah Q. Salih, N. M. Ahmed
(109-118)

Nanotechnology development status in Malaysia: industrialization strategy and practices
Uda Hashim, Elley Nadia, Shahrir Salleh
(119-134)