Design and fabrication of quantum dot single electron transistor structure using e-beam nanolithography
U. Hashim, S. Madnasri, Z.A.Z. Jamal
(85-91)

Gate oxice leakage in poly-depleted nanoscale-MOSFET: a quantum mechanical study3
Amit Chaudhry, Jatinder Nath Roy
(93-100)

The effect of Pb concentration and annealing temperatures on optical properties of PbxS1-x films
M. F. A. Alias, E. M. N. Al-Fawade, S. K. J. Al-Ani
(101-114)

Contact technology and energy resolution of CdTe junction detectors
Ali M. Mousa , J. P. Ponpon
(115-120)

Structural, electrical and optical properties of N-(p dimethylaminobenzylidene)-p-nitroaniline thin films
E. M. El-Menyawy, H. M. Zeyada, M. M. El-Nahass
(121-134)

Structural and optical properties of evaporated Ge/Al Bilayer thin films
H. El-Nasser, F. Yakuphanoglu, A. Mahasneh, A. Ahmad
(135-144)

Refractive index measurements of a prism at grazing emergence
Salwan K. J. Al-Ani, Ghamdan A. A. Aldaby, Fatima M. Thabet
(145-155)

Effect of target density on structure and properties of sputtered indium tin oxide films
Badrul Munir, Younghee Jung, Rachmat A. Wibowo, Kyooho Kim
(157-162)